 |
 |
| Inlet |
Probe |
Ionisation |
SIMS |
| Analyzer |
TOF |
Detector |
EM |
| Resolution |
1,000 |
Detection Limit
(ppt) |
n/a |
| m/z Range |
n/a |
m/z Range Detail |
n/a |
| Sensitivity |
n/a |
Sensitivity Detail |
n/a |
| Accelerating Voltage |
n/a |
Dynamic Range |
n/a
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Features: |
-
World's smallest static SIMS instrument
- Cost <£100,000
- Ion source is static SIMS (softer ionisation than dynamic SIMS minimising damage to sample surface and giving greater sensitivity)
- 15 min sample turnaround time
- EM is a Dual Microchannel plate detector
- High resolution in the low mass range
- Data System Hardware: Pentium PC with XP
- Data System Software: GRAMS/AI
- Extra statistics:
Resolution >1,000 (FWHM) at 100 Da
Upper Mass Limit 1,000 Da
Mass Accuracy 100ppm
- Applications:
Ideal surface analyser for product quality control and fault diagnosis at or close to the point of manufacture
Analysing adhesion in coatings and composite materials
Contamination in semiconductor fabrication, pharmaceutical preparation and the environment
Testing for biocompatibility
Quality check of surface modification by plasma treatments e.g. polymers
Analysis of organic binders used as paint pre-treatments
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Options: |
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n/a |
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